Firstack Technology Test Equipment

About Test Equipment

Firstack power semiconductor test and analysis equipment for device characterization, quality verification, and production testing. Comprehensive solutions for IGBT and SiC device validation.

As an authorized distributor of Firstack Technology, BeiLuo provides a comprehensive range of Test Equipment products. These products are widely used in industrial control, automotive electronics, consumer electronics, and communication equipment. We offer a complete product line with multiple series to meet various application requirements. All products are genuine and original, backed by professional technical support and comprehensive after-sales service.

Selection Guide: How to Choose the Right Test Equipment

Product List

4 products available

Part Number ↕	Voltage Range ↕	Current Range ↕	Measurement Accuracy ↕	Static Tests ↕	Dynamic Tests ↕	Package ↕	Stock Status	Action
FTE-5000	Up to 6500V	Up to 2000A	±0.5%	IV curves, VBR, IDSS, VGE(th)	ton, toff, Eon, Eoff, Qg, trr	-	In Stock	View Details
FTC-2000	Up to 2000V	Up to 200A	±0.2%	-	-	-	In Stock	View Details
2FTE-001	-	-	-	-	-	-	In Stock	View Details
2FTE-002	Up to 2000V	Up to 1000A	-	-	-	-	In Stock	View Details

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Frequently Asked Questions

What types of tests can Firstack equipment perform?

Firstack test equipment performs comprehensive semiconductor characterization: (1) Static Tests - IV curves, breakdown voltage, leakage current, threshold voltage, on-resistance

(2) Dynamic Tests - Switching times, switching losses, gate charge, reverse recovery

(3) Thermal Tests - Rth measurement, thermal impedance

(4) Reliability Tests - HTOL, temperature cycling. The equipment supports IGBT, SiC MOSFET, GaN HEMT, and power diodes. Test sequences can be automated for production environments.

Check our test equipment specifications for detailed measurement capabilities and test types.

How do I select between curve tracer and dynamic test systems?

Selection depends on your testing requirements: (1) Curve Tracer - For static parameter measurement (IV curves, Vth, RDSon), quality verification, and incoming inspection. Lower cost, simpler operation

(2) Dynamic Test System - For switching characterization, loss measurement, and advanced parameter extraction. Required for switching performance verification

(3) Combined System - For comprehensive characterization including both static and dynamic testing. R&D and device manufacturers typically need both capabilities.

Browse our test equipment categories to compare specifications and find the optimal solution for your testing needs.