FTE-5000
Firstack FTE-5000 high-performance power module analyzer for comprehensive IGBT and SiC characterization. Supports up...
Product Overview
Description
The Firstack FTE-5000 is the state-of-the-art in power semiconductor characterization. This comprehensive analyzer supports both static and dynamic testing of IGBT and SiC power modules with industry-leading accuracy and measurement range. The system covers voltages up to 6500V and currents up to 2000A, accommodating the full range of power modules from small discretes to large industrial modules.
Static test capabilities include full IV curve characterization, breakdown voltage measurement, leakage current analysis, and temperature-dependent parameter extraction. Dynamic testing covers switching time measurement, switching loss analysis, gate charge characterization, and reverse recovery testing. The system features automated test sequences, comprehensive data logging, and detailed reporting with statistical analysis.
Product Series
Power Module Analyzer
Primary Application
Device Characterization
Key Features
- Comprehensive static and dynamic testing
- Voltage range up to 6500V
- Current range up to 2000A
- ±0.5% measurement accuracy
- Automated test sequences
- Temperature-dependent testing
- Comprehensive data logging and reporting
- IGBT and SiC device support
Specifications
| Voltage Range | Up to 6500V |
|---|---|
| Current Range | Up to 2000A |
| Measurement Accuracy | ±0.5% |
| Static Tests | IV curves, VBR, IDSS, VGE(th) |
| Dynamic Tests | ton, toff, Eon, Eoff, Qg, trr |
| Temperature Range | -40°C to +200°C |
| Interface | Ethernet, USB, GPIB |
| Software | Windows-based with automation |
Applications
Device characterization
Electronic system design
Quality verification
Electronic system design
Failure analysis
Electronic system design
R&D testing
Electronic system design
Supplier qualification
Electronic system design
Academic research
Electronic system design
FAE Expert Insights
"The FTE-5000 is an exceptional piece of equipment that I've recommended to numerous customers. The measurement accuracy is outstanding - we consistently achieve <0.5% error on critical parameters. The dual static/dynamic capability saves significant capital investment compared to buying separate systems. What sets it apart is the software - the automated sequences and reporting save hours per device. The temperature chamber integration works seamlessly for temperature-dependent characterization. For high-volume testing, the automation API integrates well with production systems. My recommendation: invest in the full temperature option - it's essential for complete characterization."
Industry-leading accuracy with comprehensive static/dynamic testing and excellent automation capabilities
— Dr. Robert Zhang, BeiLuo
Frequently Asked Questions
What devices can the FTE-5000 test?
The FTE-5000 supports comprehensive testing of: IGBT modules (all voltage classes up to 6500V), SiC MOSFET modules (650V-3300V), GaN HEMT devices (up to 650V), Power diodes and rectifiers, IGBT discrete devices (TO-247, TO-3P, etc.). The system accommodates various package types including EconoDUAL, PrimePACK, standard modules, and discrete packages through interchangeable test fixtures. Custom fixtures can be designed for specialized packages.
Contact our FAE team for device compatibility verification and fixture recommendations.
What software capabilities does the FTE-5000 include?
The FTE-5000 includes comprehensive Windows-based software with: (1) Automated Test Sequences - Pre-defined and custom test sequences; (2) Data Logging - Complete test data storage with timestamp; (3) Statistical Analysis - Histograms, Cpk calculations, trend analysis; (4) Report Generation - PDF and Excel reports with graphs; (5) Remote Control - API for integration with production systems; (6) Database Integration - SQL database for test data management; (7) User Management - Multi-level access control. The software is continuously updated with new features and device support.
Request a software demonstration to see the full capabilities of the FTE-5000 test system.