Advanced Logic Manufacturing Solution
Application
Description
Complete etching and deposition solution for advanced logic device manufacturing including FinFET and GAA transistor fabrication
Core Advantages
Recommended Bill of Materials (BOM)
| Item | Part Number | Description | Quantity | Datasheet |
|---|---|---|---|---|
| 1 | Primo AD-RIE | Dielectric etching system | 4 | 📄 Download |
| 2 | Primo SSC | Silicon etching system | 4 | 📄 Download |
| 3 | Primo iDEA | CVD deposition system | 3 | 📄 Download |
| 4 | Automation System | Wafer handling automation | 1 | 📄 Download |
Applications
Technical Specifications
Customer Success Stories
Leading Asian Foundry
Semiconductor Manufacturing | 5nm Logic Production
Challenge
The customer needed to ramp 5nm production with stringent requirements for critical dimension control and defect density. Existing equipment had limitations in uniformity and selectivity for advanced multi-patterning processes.
Solution
AMEC provided a complete solution including 8 etching systems and 3 deposition systems. Our process team worked closely with the customer to develop optimized recipes for fin etching, gate etching, and contact etching. Extensive process matching ensured consistent results across all chambers.
Results
The customer achieved successful 5nm ramp with yield targets met within 6 months. CD uniformity improved by 25% compared to previous generation equipment. Defect density met aggressive targets for high-volume production. The customer has since expanded with additional AMEC equipment.
Major Memory Manufacturer
Memory Manufacturing | Advanced DRAM Production
Challenge
DRAM capacitor etching required extreme aspect ratios (>50:1) with straight profiles and minimal bowing. Existing equipment struggled with profile control and repeatability at these extreme dimensions.
Solution
AMEC deployed Primo SSC systems optimized for high aspect ratio etching. Custom process development addressed the specific requirements for capacitor etching. Chamber matching and process control algorithms ensured wafer-to-wafer consistency.
Results
The customer achieved >50:1 aspect ratios with straight profiles and <2% bowing. Yield improved by 15% compared to previous equipment. Production throughput met capacity targets. The solution is now standard for new DRAM generations.
FAE Expert Insights
Dr. James Chen
Principal FAE - Etching Technology
20 years
Professional Insights
Key considerations: Atomic-level precision is essential for advanced node manufacturing; Multi-patterning support is critical for sub-7nm devices; Process integration expertise is as important as equipment capability; Chamber matching ensures consistent results across high-volume production; Total cost of ownership must include yield impact, not just equipment cost. Common pitfalls to avoid: Focusing only on equipment specifications without considering process integration; Underestimating the importance of chamber matching in multi-chamber configurations; Not planning for process development time in the project schedule; Overlooking the impact of consumables cost on total cost of ownership.
Key Takeaways
- Atomic-level precision is essential for advanced node manufacturing
- Multi-patterning support is critical for sub-7nm devices
- Process integration expertise is as important as equipment capability
- Chamber matching ensures consistent results across high-volume production
- Total cost of ownership must include yield impact, not just equipment cost
Decision Framework
Solution Selection Decision Framework
Steps:
- Evaluate application requirements and performance metrics
- Compare solution advantages considering cost and supply chain
- Reference success cases and customer feedback
- Consult FAE for professional recommendations